Chemistry & Bichemistry

W60 Scanning Probe Microscopy for Nanoscience and Nanotechnology. Scanning Probe Microscopes are a class of tools that enable the nanoscale world to be imaged, measured, and manipulated. The most prominent member of the SPM family, the Atomic Force Microscope (AFM) will be used to investigate the surfaces of various materials from the disciplines of biology, chemistry, engineering, and geology. The AFM will be used to discuss the common capabilities and problems associated with the various AFM data acquisition modes, and provide hands-on experience in using the instrument. A major portion of the course will consist of an independent project using the instrument. Students will have a choice of a project related to their own discipline. Since time-sharing is critical to the success of the project, students will be required to sing-up for instrument time outside of class hours. Students who participate in this course will have a firm understanding of the functional principles of the AFM and the challenges involved in interpreting, quantifying, and improving the quality of the data. Evaluation of the course will be bvased on the independent project, a class presentation of a journal article relating to the subject matter, and a final paper. Students of sophomore or higher standing in any of the sciences and engineering fields are welcome to enroll in this course. K. Sinniah. 2:00 p.m. to 5:00 p.m.

IDIS-W63 The Science and Practical Applications of Fluorescence. M. Muyskens.