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The van der Pauw Theorem

Professor David Van Baak, Calvin College
Tuesday, April 1 SB110

No electrical measurement is of more frequent use to the semiconductor industry than that of 'sheet resistance', and a standard technique for this measurement is the van der Pauw method.  This talk describes and demonstrates that method, and the spectacular mathematics that lies behind its validity.  With connections to the theory of complex variables and the conformal mapping theorem, and with additional applications to 'cross capacitance' and fundamental electrical standards, the van der Pauw theorem illustrates wonderfully the deep connections between truth, beauty, and applicability in mathematical physics.







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